Filmetrics – Optical Thin Film Thickness Measurement Tool

 

Thickness, refractive index, and extinction coefficients are measured quickly and easily with Filmetrics’ advanced spectrometry systems. Simply plug the Filmetrics system into your computer’s parallel port and start making measurements. The entire system sets up in minutes and measurements can be made by anyone with basic computer skills. This simple hardware and intuitive software provides thin-film knowledge to a whole new group of users. Systems are available with wavelengths from 215 nm to 1700 nm enabling thickness measurements of films 10 angstroms to 350 um thick. The Filmetrics systems measure transparent thin films made from virtually all common materials. Systems’ application includes: Semiconductor Fabrication, Liquid crystal displays, Optical coatings and Biomedical, both manual and auto systems available.

 

 

Measuring Principle

 

F20 Thin-film measurement system

 

F40 with Microscope

 

F50 Automated Thin-film thickness mapping system