n&k - n&k 1700 Manual-Load Metrology System

 

Broadband spectrometry for various aspects of thin film head AlTiC wafer processing steps.

 

Spotsize: 50um. The n&k 1700 system is designed for handling 100mm, 150mm and 200mm wafers. These systems simultaneously determine thickness, n and k in the spectral range of 190-1000nm, and provide non-destructive, real time, high throughput measurements directly on the device. These systems encompass advanced pattern recognition software, patented microspot measurement technology and a unique all-reflective optical based system.

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n&k Technology, Inc. - The n&k 1700 Manual-Load Metrology System