Schmitt - Surface Roughness Measurement System

 

 

  • Using advanced laser scattering technique, the key advantages are fast, accurate and non-contact measurement.
  •  Several models for different applications are available , e.g. Hand-held (Model micro scan)、Fully Automatic (Model TMS-2000) 、High Throughput for double side measurement (Model DTM-2000)
  • Different wavelengths for different application are available。e.g. 670nm, 1310nm …
  • Ultra-high roughness resolution : 0.02A,  high precision: +/- 0.2 A；Quick measurement time :  Up to 100 points per second (Model TMS-2000)
  • Measureable parameters : Ra, Rq, P-V, Reflectance , TIS , RMS slope …and entire wafer roughness 3D-mapping
  • Insensitive to floor vibration, vibration isolation is not required.
  • Please visit the website : www.schmitt-ind.com for details.

 

 

 

 

 


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