AXIC - Optical Thin Film Analyzer & X-ray Fluorescence Thin Film Analyzer (XRF)

 

The patented AXIC TYGER Thin-film Analyzer is a multi-angle reflectometer that characterizes thin transparent films by analyzing reflected light from a laser source... and it makes multiple precise thin-film measurements in seconds. TYGER'S advanced design incorporates a unique software algorithm and laser optics to measure the actual film thickness, refractive index and absorption.


The Precision 1000-B® readily analyzes compound thin films utilized in semiconductor, superconductor, magnetic and optical applications. This fully automatic system provides rapid composition and thickness analysis of films in the production environment. In process development, the Precision 1000-B® is utilized to characterize the effect of variables on the film deposition process. Once the process is defined, the Precision 1000-B® is utilized as a quality control monitor to insure the composition and thickness of the production films.

 




AXIC Tyger (left) and Precision 1000-B (right)