Veeco (di) - SPM/AFM

 

The MultiMode Scanning Probe Microscope (SPM) is the world´s best-selling SPM. It performs the full range of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques to measure surface characteristics like topography, elasticity, friction, adhesion, and magnetic/electrical fields. The short mechanical path length between probe tip and sample enables very fast scan rates with utmost precision.

 

The MultiMode PicoForce System combines innovative, force-measurement features and proven SPM technology to bring unprecedented accuracy, flexibility, and repeatability to molecular biology and nanoscale materials research. The system´s MultiMode SPM provides unlimited extendibility to the PicoForce through a wide variety of automated SPM-technique image modules. Finally, the handheld PicoAngler tool permits intuitive "tactile" interpretation of molecule and force interactions via a revolutionary force-feedback feature.

 

The Digital Instruments CP-II Scanning Probe Microscope (SPM) provides high performance and value for material and physical science research. The CP-II head, designed to accept an on-axis microscope, utilizes patented ScanMaster closed-loop scan-linearization to image areas of up to 100x100 µm. The system is designed for ease-of-use with integrated high-magnification color optics and a motorized Z stage that makes finding features, changing the premounted tips, and switching samples fast and easy. The system’s complete library of both standard and advanced image modes, and a host of accessories and hardware options, guarantee application flexibility and make the CP-II the best performer of any scientific SPM in its price class.

 

Veeco di MultiMode	Veeco di PicoForce	Veeco di CP-II