Research & Development (R&D)
Process Equipment:
- A1-Laser -Laser Process Equipment
- Amerimade - Fully Automatic Wet Process System
- AXIC - RIE, PECVD, Plasma System
- CETR - Tabletop CMP eCMP System
- EVG - Spray Coating, Wafer Cleaning, Nano-imprint
- First Nano - CNTs, Nanowires Synthesis System EasyTube 2000
- First Nano - CNTs, Nanowires Synthesis System EasyTube 3000
- First Nano - Horizontal Diffusion Furnace Model Easytube 6000
- Gatan - Sample Preparation System
- CMP & Wafer Backside Grinder
- SST - Table-top Solder Reflow Furnace Model 1200
- SST - Programmable Vacuum Solder Reflow Furnace Model 3130
- SST - Programmable Vacuum Solder Reflow Furnace Model 3140 / 3150
Metrology & Inspection Equipment:
- 4D- Dynamic Interferometer
- AXIC - Optical Thin Film Analyzer & X-ray Fluorescence Thin Film Analyzer (XRF)
- CETR - Combined Mechanical and Tribology Tester - UMT
- CETR - UNMT
- FEI - Conventional EM
- Phenom (Desktop SEM)
- Filmetrics - Optical Thin Film Thickness Measurement Tool
- Imago - 3D Atom Probe Microscope
- Invenious - Flat Scanner and Six -Axis Motion Nano-Positioner
- MicroSense Probe - Non-contact Capacitance Gauge
- MicroSense VSM - Vibrating Sample Magnetometer
- nPoint - Nano Positioning & Nano Motion Control Equipment
- PPL - Automatic Vision CD Measurement System
- Schmitt - Surface Roughness Measurement System
- Shb - Thin-Film Hysteresis Loop Tracers
- Thermo Noran - X-ray Fluorescence Thin Film Thickness / Composition Mueasurement Tool
- Veeco (Dektak) - Stylus Profiler
- Veeco (di) - SPM/AFM
- Veeco (Wyko) - Optical Profiler
- VIC - Leak Detector
Others:
