R & D Products
--Process Equipment
AXIC - RIE, PECVD, Plasma System
CVD Equipment - CNT Growth System
Tamarack - Photolithography System
Gatan (Sagitta) - Sample Preparation System
EVG - Spray Coating, Wafer Cleaning, Nano-imprint
SST International
First Nano - CNTs, Nanowires Synthesis System
--Metrology & Inspection Equipment
Veeco (di) - SPM/AFM
Veeco (Wyko) - Optical Profiler
Veeco (Dektak) - Stylus Profiler
Imago - 3D Atom Probe Microscope
4D - Dynamic Interferometer
AXIC - Optical Thin Film Analyzer & X-ray Fluorescence Thin Film Analyzer (XRF)
PPL - Automatic Vision & Laser Measurement System
VIC - Leak Detector
CETR - Universal Nano Micro Macro Tribology Tester
--Others
Herzan - Vibration Isolation System
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Process Equipment
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Metrology & Inspection Equipment
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Copyright 2006 DYMEK COMPANY LIMITED