FR-Ultra is a unit dedicated for the fast, accurate and non-destructive measurement of thick and ultra-thick semiconductor and transparent layers.
FR-Ultra is a unit dedicated for the fast, accurate and non-destructive measurement of thick and ultra-thick semiconductor and transparent layers.
Thanks to its advanced optics, FR-Ultra can measure either smooth or rough films & substrates of very high thickness.
Features
Typical applications include:
Applications
(Contact us with your requirements)
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